The sample was sieved to the grain size interval less than 250 µm. IMAGE_OF_SAMPLE: NO PHOTO
XRD Analysis
40 kV - 30 mA, 6.5-9.5 keV File: alun20_mdi, *.out (smear mount on quartz plate) References: JCPDS #41-1467; Huebner's reference patterns Found: Natroalunite and weak, unidentified reflections at 3.33, 2.90, 1.912, 1.719, 1.606, and 1.475 Angstroms Comment: Moderately sharp and well-formed peaks suggest only moderate crystallinity and compositional heterogeneity. Some alunite peak intensities do match the relative intensities of the reference patterns. J.S. Huebner, J. Pickrell, T. Schaefer, written communication 1994
X Units
cm⁻¹
Y Units
Absorbance
Data Points
2,126
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Attribution
USGS Spectral Library Version 7, U.S. Geological Survey