Spectralon99WhiteRef LSPHERE

Spectrum Details

Modality

NIR

Category

man-made

Material Type

Spectralon White Reference Panel

Sample ID

none

Collection Locality

TBD

Spectral Purity

1a2_3_4_ # 1= 0.2-3, 2= 1.5-6, 3= 6-25, 4= 20-150 microns

Composition / XRD

None # XRF, EPMA, ICP(Trace), WChem

Sample Description

Spectralon white reference panel purchased from Labsphere Inc. (North Sutton, New Hampshire, USA). The absolute reflectance of Spectralon was derived using the procedure described in Clark and others (1990) for halon. In this procedure, the reflectance of Spectralon was measured relative to sulfur and ground aluminum. Clark, R.N., King, T.V., Klejwa, M., Swayze, G.A., & Vergo, N. (1990). High spectral resolution reflectance spectroscopy of minerals. Journal of Geophysical Research: Solid Earth (1978�2012), 95(B8), 12653-12680. http://dx.doi.org/10.1029/JB095iB08p12653

X Units

cm⁻¹

Y Units

Absorbance

Data Points

2,126